Post-silicon programmed body-biasing platform suppressing device variability in 45 nm CMOS technology.

Hiroaki Suzuki Masanori Kurimoto Tadao Yamanaka Hidehiro Takata Hiroshi Makino Hirofumi Shinohara Post-silicon programmed body-biasing platform suppressing device variability in 45 nm CMOS technology. 15-20 2008 ISLPED http://doi.acm.org/10.1145/1393921.1393931 conf/islped/2008 db/conf/islped/islped2008.html#SuzukiKYTMS08