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BibTeX record conf/islped/RaoSBS03
@inproceedings{DBLP:conf/islped/RaoSBS03, author = {Rajeev R. Rao and Ashish Srivastava and David T. Blaauw and Dennis Sylvester}, editor = {Ingrid Verbauwhede and Hyung Roh}, title = {Statistical estimation of leakage current considering inter- and intra-die process variation}, booktitle = {Proceedings of the 2003 International Symposium on Low Power Electronics and Design, 2003, Seoul, Korea, August 25-27, 2003}, pages = {84--89}, publisher = {{ACM}}, year = {2003}, url = {https://doi.org/10.1145/871506.871530}, doi = {10.1145/871506.871530}, timestamp = {Tue, 06 Nov 2018 16:59:21 +0100}, biburl = {https://dblp.org/rec/conf/islped/RaoSBS03.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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