Saibal Mukhopadhyay Keunwoo Kim Ching-Te Chuang Kaushik Roy Modeling and analysis of total leakage currents in nanoscale double gate devices and circuits. 8-13 2005 conf/islped/2005 ISLPED http://doi.acm.org/10.1145/1077603.1077608 db/conf/islped/islped2005.html#MukhopadhyayKCR05