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BibTeX record conf/islped/KeaneKK07
@inproceedings{DBLP:conf/islped/KeaneKK07, author = {John Keane and Tony Tae{-}Hyoung Kim and Chris H. Kim}, editor = {Diana Marculescu and Anand Raghunathan and Ali Keshavarzi and Vijaykrishnan Narayanan}, title = {An on-chip {NBTI} sensor for measuring {PMOS} threshold voltage degradation}, booktitle = {Proceedings of the 2007 International Symposium on Low Power Electronics and Design, 2007, Portland, OR, USA, August 27-29, 2007}, pages = {189--194}, publisher = {{ACM}}, year = {2007}, url = {https://doi.org/10.1145/1283780.1283821}, doi = {10.1145/1283780.1283821}, timestamp = {Tue, 06 Nov 2018 16:59:21 +0100}, biburl = {https://dblp.org/rec/conf/islped/KeaneKK07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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