Row/column redundancy to reduce SRAM leakage in presence of random within-die delay variation.

Maziar Goudarzi Tohru Ishihara Row/column redundancy to reduce SRAM leakage in presence of random within-die delay variation. 93-98 2008 ISLPED http://doi.acm.org/10.1145/1393921.1393947 conf/islped/2008 db/conf/islped/islped2008.html#GoudarziI08