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BibTeX record conf/isie/SchaferSKDZ23
@inproceedings{DBLP:conf/isie/SchaferSKDZ23, author = {Stephan Sch{\"{a}}fer and Dirk Sch{\"{o}}ttke and Thomas K{\"{a}}mpfe and Vasil Denkov and Aaron Zielstorff}, title = {Component Test - Test Strategies with Asset Administration Shells}, booktitle = {32nd {IEEE} International Symposium on Industrial Electronics, {ISIE} 2023, Helsinki, Finland, June 19-21, 2023}, pages = {1--7}, publisher = {{IEEE}}, year = {2023}, url = {https://doi.org/10.1109/ISIE51358.2023.10228026}, doi = {10.1109/ISIE51358.2023.10228026}, timestamp = {Sat, 30 Sep 2023 09:50:20 +0200}, biburl = {https://dblp.org/rec/conf/isie/SchaferSKDZ23.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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