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BibTeX record conf/isie/JeleniewskiNRKF23
@inproceedings{DBLP:conf/isie/JeleniewskiNRKF23, author = {Tom Jeleniewski and Hamied Nabizada and Jonathan Tobias Reif and Aljosha K{\"{o}}cher and Alexander Fay}, title = {A Semantic Model to Express Process Parameters and their Interdependencies in Manufacturing}, booktitle = {32nd {IEEE} International Symposium on Industrial Electronics, {ISIE} 2023, Helsinki, Finland, June 19-21, 2023}, pages = {1--6}, publisher = {{IEEE}}, year = {2023}, url = {https://doi.org/10.1109/ISIE51358.2023.10228021}, doi = {10.1109/ISIE51358.2023.10228021}, timestamp = {Tue, 07 May 2024 20:09:55 +0200}, biburl = {https://dblp.org/rec/conf/isie/JeleniewskiNRKF23.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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