BibTeX record conf/isi/ZhangZ11

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@inproceedings{DBLP:conf/isi/ZhangZ11,
  author       = {Sai{-}Yin Zhang and
                  Zhong{-}Zhan Zhang},
  title        = {Analysis of accelerated degradation test under constant stress with
                  errors for longitudinal data},
  booktitle    = {2011 {IEEE} International Conference on Intelligence and Security
                  Informatics, {ISI} 2011, Beijing, China, 10-12 July, 2011},
  pages        = {320--324},
  publisher    = {{IEEE}},
  year         = {2011},
  url          = {https://doi.org/10.1109/ISI.2011.5984106},
  doi          = {10.1109/ISI.2011.5984106},
  timestamp    = {Wed, 16 Oct 2019 14:14:48 +0200},
  biburl       = {https://dblp.org/rec/conf/isi/ZhangZ11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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