Patrick J. Schroeder Pankaj Bolaki Vijayram Gopu Comparing the Fault Detection Effectiveness of N-way and Random Test Suites. 49-59 2004 conf/isese/2004 ISESE http://doi.ieeecomputersociety.org/10.1109/ISESE.2004.16 db/conf/isese/isese2004.html#SchroederBG04