BibTeX record conf/isdcs/MaityKC0PB20

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@inproceedings{DBLP:conf/isdcs/MaityKC0PB20,
  author       = {Hillol Maity and
                  Kaushik Khatua and
                  Santanu Chattopadhyay and
                  Indranil Sengupta and
                  Girish Patankar and
                  Parthajit Bhattacharya},
  title        = {A New Test Vector Reordering Technique for Low Power Combinational
                  Circuit Testing},
  booktitle    = {3rd International Symposium on Devices, Circuits and Systems, {ISDCS}
                  2020, Howrah, India, March 4-6, 2020},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/ISDCS49393.2020.9262975},
  doi          = {10.1109/ISDCS49393.2020.9262975},
  timestamp    = {Thu, 03 Dec 2020 12:39:24 +0100},
  biburl       = {https://dblp.org/rec/conf/isdcs/MaityKC0PB20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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