BibTeX record conf/iscas/RzepaGKG15

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@inproceedings{DBLP:conf/iscas/RzepaGKG15,
  author       = {Gerhard Rzepa and
                  Wolfgang Goes and
                  Ben Kaczer and
                  Tibor Grasser},
  title        = {Characterization and modeling of reliability issues in nanoscale devices},
  booktitle    = {2015 {IEEE} International Symposium on Circuits and Systems, {ISCAS}
                  2015, Lisbon, Portugal, May 24-27, 2015},
  pages        = {2445--2448},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/ISCAS.2015.7169179},
  doi          = {10.1109/ISCAS.2015.7169179},
  timestamp    = {Thu, 13 Jul 2023 08:31:49 +0200},
  biburl       = {https://dblp.org/rec/conf/iscas/RzepaGKG15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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