DBLP Record 'conf/iscas/KimHK05'

BibTeX

@inproceedings{DBLP:conf/iscas/KimHK05,
  author    = {Ju Yeob Kim and
               Sung Je Hong and
               Jong Kim},
  title     = {Parallely testable design for detection of neighborhood
               pattern sensitive faults in high density DRAMs},
  booktitle = {ISCAS (6)},
  year      = {2005},
  pages     = {5854-5857},
  ee        = {http://dx.doi.org/10.1109/ISCAS.2005.1465970},
  crossref  = {DBLP:conf/iscas/2005},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/iscas/2005,
  title     = {International Symposium on Circuits and Systems (ISCAS 2005),
               23-26 May 2005, Kobe, Japan},
  publisher = {IEEE},
  year      = {2005},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}