CMOS Reliability Improvements Through a New Fault Tolerant Technique.

Cristiana Bolchini Giacomo Buonanno Donatella Sciuto Renato Stefanelli CMOS Reliability Improvements Through a New Fault Tolerant Technique. 83-86 1994 ISCAS db/conf/iscas/iscas1994-4.html#BolchiniBSS94