BibTeX
@inproceedings{DBLP:conf/iscas/AccianiBF07,
author = {Giuseppe Acciani and
Gioacchino Brunetti and
Girolamo Fornarelli},
title = {Automatic Detection of Solder Joint Defects on Integrated
Circuits},
booktitle = {ISCAS},
year = {2007},
pages = {1021-1024},
ee = {http://doi.ieeecomputersociety.org/10.1109/ISCAS.2007.378143},
crossref = {DBLP:conf/iscas/2007},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/iscas/2007,
title = {International Symposium on Circuits and Systems (ISCAS 2007),
27-20 May 2007, New Orleans, Louisiana, USA},
publisher = {IEEE},
year = {2007},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2007-07-16 by Michael Ley (ley@uni-trier.de)