Characterization of Transistor Mismatch for Statistical CAD of Submicron CMOS Analog Circuits.

Christopher J. Abel Christopher Michael Mohammed Ismail C. S. Teng R. Lahrio Characterization of Transistor Mismatch for Statistical CAD of Submicron CMOS Analog Circuits. 1401-1404 1993 ISCAS db/conf/iscas/iscas1993-2.html#AbelMITL93