BibTeX record conf/iscas/0007NSKKKA23

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@inproceedings{DBLP:conf/iscas/0007NSKKKA23,
  author       = {Om Prakash and
                  Rodion Novkin and
                  Virinchi Roy Surabhi and
                  Prashanth Krishnamurthy and
                  Ramesh Karri and
                  Farshad Khorrami and
                  Hussam Amrouch},
  title        = {Comprehensive Reliability Analysis of 22nm {FDSOI} {SRAM} from Device
                  Physics to Deep Learning},
  booktitle    = {{IEEE} International Symposium on Circuits and Systems, {ISCAS} 2023,
                  Monterey, CA, USA, May 21-25, 2023},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/ISCAS46773.2023.10182096},
  doi          = {10.1109/ISCAS46773.2023.10182096},
  timestamp    = {Mon, 05 Feb 2024 20:30:51 +0100},
  biburl       = {https://dblp.org/rec/conf/iscas/0007NSKKKA23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}