Seongmoo Heo Kenneth C. Barr Mark Hampton Krste Asanovic Dynamic Fine-Grain Leakage Reduction Using Leakage-Biased Bitlines. 137-147 2002 conf/isca/2002 ISCA http://computer.org/proceedings/isca/1605/16050137abs.htm db/conf/isca/isca2002.html#HeoBHA02