BibTeX record conf/irps/ZhuHCZYZZMH18

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@inproceedings{DBLP:conf/irps/ZhuHCZYZZMH18,
  author       = {Jiejie Zhu and
                  Bin Hou and
                  Lixiang Chen and
                  Qing Zhu and
                  Ling Yang and
                  Xiaowei Zhou and
                  Peng Zhang and
                  Xiaohua Ma and
                  Yue Hao},
  title        = {Threshold voltage shift and interface/border trapping mechanism in
                  Al2O3/AlGaN/GaN MOS-HEMTs},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
                  CA, USA, March 11-15, 2018},
  pages        = {1},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/IRPS.2018.8353704},
  doi          = {10.1109/IRPS.2018.8353704},
  timestamp    = {Fri, 14 Jun 2024 12:35:01 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/ZhuHCZYZZMH18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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