BibTeX record conf/irps/ZhouZYJLZSYLDZW21

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@inproceedings{DBLP:conf/irps/ZhouZYJLZSYLDZW21,
  author       = {Longda Zhou and
                  Zhaohao Zhang and
                  Hong Yang and
                  Zhigang Ji and
                  Qianqian Liu and
                  Qingzhu Zhang and
                  Eddy Simoen and
                  Huaxiang Yin and
                  Jun Luo and
                  Anyan Du and
                  Chao Zhao and
                  Wenwu Wang},
  title        = {A Fast {DCIV} Technique for Characterizing the Generation and Repassivation
                  of Interface Traps Under {DC/} {AC} {NBTI} Stress/Recovery Condition
                  in Si p-FinFETs},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
                  CA, USA, March 21-25, 2021},
  pages        = {1--7},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/IRPS46558.2021.9405105},
  doi          = {10.1109/IRPS46558.2021.9405105},
  timestamp    = {Thu, 05 Jan 2023 08:33:03 +0100},
  biburl       = {https://dblp.org/rec/conf/irps/ZhouZYJLZSYLDZW21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}