BibTeX record conf/irps/ZhouWZWDMBSBV20

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@inproceedings{DBLP:conf/irps/ZhouWZWDMBSBV20,
  author       = {Huimei Zhou and
                  Miaomiao Wang and
                  Jingyun Zhang and
                  Koji Watanabe and
                  Curtis Durfee and
                  Shogo Mochizuki and
                  Ruqiang Bao and
                  Richard G. Southwick and
                  Maruf Bhuiyan and
                  Basker Veeraraghavan},
  title        = {{NBTI} Impact of Surface Orientation in Stacked Gate-All-Around Nanosheet
                  Transistor},
  booktitle    = {2020 {IEEE} International Reliability Physics Symposium, {IRPS} 2020,
                  Dallas, TX, USA, April 28 - May 30, 2020},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/IRPS45951.2020.9129023},
  doi          = {10.1109/IRPS45951.2020.9129023},
  timestamp    = {Wed, 28 Jun 2023 16:23:50 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/ZhouWZWDMBSBV20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}