BibTeX record conf/irps/ZhouLSCZLZCCZW20

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@inproceedings{DBLP:conf/irps/ZhouLSCZLZCCZW20,
  author       = {David C. Zhou and
                  William Li and
                  Jingyu Shen and
                  Leilei Chen and
                  Thomas Zhao and
                  Kent Lin and
                  Martin Zhang and
                  Larry Chen and
                  H. C. Chiu and
                  Jeff Zhang and
                  Roy K.{-}Y. Wong},
  title        = {Reliability of 200mm E-mode GaN-on-Si Power HEMTs},
  booktitle    = {2020 {IEEE} International Reliability Physics Symposium, {IRPS} 2020,
                  Dallas, TX, USA, April 28 - May 30, 2020},
  pages        = {1--3},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/IRPS45951.2020.9129220},
  doi          = {10.1109/IRPS45951.2020.9129220},
  timestamp    = {Tue, 18 Aug 2020 17:12:22 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/ZhouLSCZLZCCZW20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}