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BibTeX record conf/irps/ZhouJCV18
@inproceedings{DBLP:conf/irps/ZhouJCV18, author = {C. Zhou and Keith A. Jenkins and P. I. Chuang and Christos Vezyrtzis}, title = {Effect of {HCI} degradation on the variability of {MOSFETS}}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame, CA, USA, March 11-15, 2018}, pages = {1}, publisher = {{IEEE}}, year = {2018}, url = {https://doi.org/10.1109/IRPS.2018.8353684}, doi = {10.1109/IRPS.2018.8353684}, timestamp = {Wed, 16 Oct 2019 14:14:55 +0200}, biburl = {https://dblp.org/rec/conf/irps/ZhouJCV18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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