BibTeX record conf/irps/ZhangSSROSSYCJL15

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@inproceedings{DBLP:conf/irps/ZhangSSROSSYCJL15,
  author       = {Wenyi Zhang and
                  M. C. Silvestre and
                  A. Selvam and
                  E. Ramanathan and
                  C. Ordonio and
                  J. Schaller and
                  Tian Shen and
                  Kong Boon Yeap and
                  C. Capasso and
                  Patrick Justison and
                  J. H. Lee},
  title        = {An investigation of process dependence of porous {IMD} {TDDB}},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
                  CA, USA, April 19-23, 2015},
  pages        = {1},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/IRPS.2015.7112819},
  doi          = {10.1109/IRPS.2015.7112819},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/ZhangSSROSSYCJL15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}