BibTeX record conf/irps/ZahedmaneshPTC21

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@inproceedings{DBLP:conf/irps/ZahedmaneshPTC21,
  author       = {Houman Zahedmanesh and
                  Olalla Varela Pedreira and
                  Zsolt Tokei and
                  Kristof Croes},
  title        = {Electromigration limits of copper nano-interconnects},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
                  CA, USA, March 21-25, 2021},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/IRPS46558.2021.9405091},
  doi          = {10.1109/IRPS46558.2021.9405091},
  timestamp    = {Mon, 01 May 2023 13:01:28 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/ZahedmaneshPTC21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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