BibTeX record conf/irps/ZagniCPPMMZV20

• > Home > conf/irps/ZagniCPPMMZV20

@inproceedings{DBLP:conf/irps/ZagniCPPMMZV20,
  author       = {Nicol{\`{o}} Zagni and
                  Alessandro Chini and
                  Francesco Maria Puglisi and
                  Paolo Pavan and
                  Matteo Meneghini and
                  Gaudenzio Meneghesso and
                  Enrico Zanoni and
                  Giovanni Verzellesi},
  title        = {Trap Dynamics Model Explaining the {RON} Stress/Recovery Behavior
                  in Carbon-Doped Power AlGaN/GaN MOS-HEMTs},
  booktitle    = {2020 {IEEE} International Reliability Physics Symposium, {IRPS} 2020,
                  Dallas, TX, USA, April 28 - May 30, 2020},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/IRPS45951.2020.9128816},
  doi          = {10.1109/IRPS45951.2020.9128816},
  timestamp    = {Tue, 07 May 2024 20:11:34 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/ZagniCPPMMZV20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}