BibTeX record conf/irps/YokogawaT18

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@inproceedings{DBLP:conf/irps/YokogawaT18,
  author       = {Shinji Yokogawa and
                  Kazuki Tate},
  title        = {Reliability evaluation of defect accounted time-dependent dielectric
                  breakdown with competing-mixture distribution},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
                  CA, USA, March 11-15, 2018},
  pages        = {2--1},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/IRPS.2018.8353662},
  doi          = {10.1109/IRPS.2018.8353662},
  timestamp    = {Sat, 19 Oct 2019 20:31:23 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/YokogawaT18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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