BibTeX record conf/irps/YamagishiC19

download as .bib file

@inproceedings{DBLP:conf/irps/YamagishiC19,
  author       = {Yuji Yamagishi and
                  Yasuo Cho},
  title        = {High Resolution Observation of Subsurface Defects at SiO2/4H-SiC Interfaces
                  by Local Deep Level Transient Spectroscopy Based on Time-Resolved
                  Scanning Nonlinear Dielectric Microscopy},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey,
                  CA, USA, March 31 - April 4, 2019},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/IRPS.2019.8720482},
  doi          = {10.1109/IRPS.2019.8720482},
  timestamp    = {Sun, 25 Oct 2020 23:11:44 +0100},
  biburl       = {https://dblp.org/rec/conf/irps/YamagishiC19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.