BibTeX record conf/irps/XuZJLLLDZWCZLXJWMZLLFWL23

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@inproceedings{DBLP:conf/irps/XuZJLLLDZWCZLXJWMZLLFWL23,
  author       = {Xinyi Xu and
                  Hongchao Zhang and
                  Chuanpeng Jiang and
                  Jinhao Li and
                  Shiyang Lu and
                  Yunpeng Li and
                  Honglei Du and
                  Xueying Zhang and
                  Zhaohao Wang and
                  Kaihua Cao and
                  Weisheng Zhao and
                  Shuqin Lyu and
                  Hao Xu and
                  Bonian Jiang and
                  Le Wang and
                  Bowen Man and
                  Cong Zhang and
                  Dandan Li and
                  Shuhui Li and
                  Xiaofei Fan and
                  Gefei Wang and
                  Hong{-}xi Liu},
  title        = {Full reliability characterization of three-terminal {SOT-MTJ} devices
                  and corresponding arrays},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2023, Monterey,
                  CA, USA, March 26-30, 2023},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/IRPS48203.2023.10117643},
  doi          = {10.1109/IRPS48203.2023.10117643},
  timestamp    = {Wed, 24 May 2023 09:43:44 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/XuZJLLLDZWCZLXJWMZLLFWL23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}