BibTeX record conf/irps/XuCBCWWM19

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@inproceedings{DBLP:conf/irps/XuCBCWWM19,
  author       = {Lyuan Xu and
                  Jingchen Cao and
                  Bharat L. Bhuva and
                  Indranil Chatterjee and
                  Shi{-}Jie Wen and
                  Richard Wong and
                  Lloyd W. Massengill},
  title        = {Single-Event Upset Responses of Dual- and Triple-Well {D} Flip-Flop
                  Designs in 7-nm Bulk FinFET Technology},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey,
                  CA, USA, March 31 - April 4, 2019},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/IRPS.2019.8720514},
  doi          = {10.1109/IRPS.2019.8720514},
  timestamp    = {Wed, 21 Jun 2023 21:04:27 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/XuCBCWWM19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}