BibTeX record conf/irps/XiongFPBNBDWWFB22

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@inproceedings{DBLP:conf/irps/XiongFPBNBDWWFB22,
  author       = {Yoni Xiong and
                  Alexandra Feeley and
                  Nicholas J. Pieper and
                  Dennis R. Ball and
                  Balaji Narasimham and
                  John Brockman and
                  N. A. Dodds and
                  S. A. Wender and
                  Shi{-}Jie Wen and
                  Rita Fung and
                  Bharat L. Bhuva},
  title        = {Soft Error Characterization of D-FFs at the 5-nm Bulk FinFET Technology
                  for the Terrestrial Environment},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2022, Dallas,
                  TX, USA, March 27-31, 2022},
  pages        = {7},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/IRPS48227.2022.9764523},
  doi          = {10.1109/IRPS48227.2022.9764523},
  timestamp    = {Wed, 24 May 2023 09:11:21 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/XiongFPBNBDWWFB22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}