BibTeX record conf/irps/WuFTRTVBGLK21

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@inproceedings{DBLP:conf/irps/WuFTRTVBGLK21,
  author       = {Zhicheng Wu and
                  Jacopo Franco and
                  Brecht Truijen and
                  Philippe Roussel and
                  Stanislav Tyaginov and
                  Michiel Vandemaele and
                  Erik Bury and
                  Guido Groeseneken and
                  Dimitri Linten and
                  Ben Kaczer},
  title        = {Physics-based device aging modelling framework for accurate circuit
                  reliability assessment},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
                  CA, USA, March 21-25, 2021},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/IRPS46558.2021.9405106},
  doi          = {10.1109/IRPS46558.2021.9405106},
  timestamp    = {Sun, 02 Oct 2022 16:09:06 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/WuFTRTVBGLK21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}