BibTeX record conf/irps/WeirPMPBBP19

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@inproceedings{DBLP:conf/irps/WeirPMPBBP19,
  author       = {Bonnie E. Weir and
                  Vani Prasad and
                  Shahriar Moinian and
                  SangJune Park and
                  Joseph Blasko and
                  Jason Brown and
                  Jayanthi Pallinti},
  title        = {Utilizing a Thorough Understanding of Critical Aging and Failure Mechanisms
                  in finFET Technologies to Enable Reliable High Performance Circuits},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey,
                  CA, USA, March 31 - April 4, 2019},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/IRPS.2019.8720475},
  doi          = {10.1109/IRPS.2019.8720475},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/WeirPMPBBP19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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