BibTeX record conf/irps/WatanabeSHSKTIS22

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@inproceedings{DBLP:conf/irps/WatanabeSHSKTIS22,
  author       = {K. Watanabe and
                  T. Shimada and
                  K. Hirose and
                  H. Shindo and
                  D. Kobayashi and
                  Takaho Tanigawa and
                  Shoji Ikeda and
                  Takamitsu Shinada and
                  Hiroki Koike and
                  Tetsuo Endoh and
                  T. Makino and
                  Takeshi Ohshima},
  title        = {Design and Heavy-Ion Testing of {MTJ/CMOS} Hybrid LSIs for Space-Grade
                  Soft-Error Reliability},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2022, Dallas,
                  TX, USA, March 27-31, 2022},
  pages        = {54--1},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/IRPS48227.2022.9764491},
  doi          = {10.1109/IRPS48227.2022.9764491},
  timestamp    = {Sun, 02 Oct 2022 16:09:06 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/WatanabeSHSKTIS22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}