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BibTeX record conf/irps/WangZZXMZHXDL20
@inproceedings{DBLP:conf/irps/WangZZXMZHXDL20, author = {Yingzhe Wang and Xuefeng Zheng and Jiaduo Zhu and Shengrui Xu and Xiaohua Ma and Jincheng Zhang and Yue Hao and Linlin Xu and Jiangnan Dai and Peixian Li}, title = {Evolution of Defect in AlGaN-based Deep Ultraviolet Light Emitting Diodes During Electrical Stress}, booktitle = {2020 {IEEE} International Reliability Physics Symposium, {IRPS} 2020, Dallas, TX, USA, April 28 - May 30, 2020}, pages = {1--4}, publisher = {{IEEE}}, year = {2020}, url = {https://doi.org/10.1109/IRPS45951.2020.9128350}, doi = {10.1109/IRPS45951.2020.9128350}, timestamp = {Thu, 30 Jul 2020 15:14:26 +0200}, biburl = {https://dblp.org/rec/conf/irps/WangZZXMZHXDL20.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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