BibTeX record conf/irps/WangZZXMZHXDL20

• > Home > conf/irps/WangZZXMZHXDL20

@inproceedings{DBLP:conf/irps/WangZZXMZHXDL20,
  author       = {Yingzhe Wang and
                  Xuefeng Zheng and
                  Jiaduo Zhu and
                  Shengrui Xu and
                  Xiaohua Ma and
                  Jincheng Zhang and
                  Yue Hao and
                  Linlin Xu and
                  Jiangnan Dai and
                  Peixian Li},
  title        = {Evolution of Defect in AlGaN-based Deep Ultraviolet Light Emitting
                  Diodes During Electrical Stress},
  booktitle    = {2020 {IEEE} International Reliability Physics Symposium, {IRPS} 2020,
                  Dallas, TX, USA, April 28 - May 30, 2020},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/IRPS45951.2020.9128350},
  doi          = {10.1109/IRPS45951.2020.9128350},
  timestamp    = {Thu, 30 Jul 2020 15:14:26 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/WangZZXMZHXDL20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}