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BibTeX record conf/irps/WangSCS18
@inproceedings{DBLP:conf/irps/WangSCS18, author = {Miaomiao Wang and Richard G. Southwick and Kangguo Cheng and James H. Stathis}, title = {Lateral profiling of {HCI} induced damage in ultra-scaled FinFET devices with Id-Vd characteristics}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame, CA, USA, March 11-15, 2018}, pages = {6}, publisher = {{IEEE}}, year = {2018}, url = {https://doi.org/10.1109/IRPS.2018.8353639}, doi = {10.1109/IRPS.2018.8353639}, timestamp = {Wed, 28 Jun 2023 16:23:50 +0200}, biburl = {https://dblp.org/rec/conf/irps/WangSCS18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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