BibTeX record conf/irps/WanHCH19

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@inproceedings{DBLP:conf/irps/WanHCH19,
  author       = {H. W. Wan and
                  Y. J. Hong and
                  Y. T. Cheng and
                  M. Hong},
  title        = {{BTI} Characterization of {MBE} Si-Capped Ge Gate Stack and Defect
                  Reduction via Forming Gas Annealing},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey,
                  CA, USA, March 31 - April 4, 2019},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/IRPS.2019.8720567},
  doi          = {10.1109/IRPS.2019.8720567},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/WanHCH19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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