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BibTeX record conf/irps/WanHCH19
@inproceedings{DBLP:conf/irps/WanHCH19, author = {H. W. Wan and Y. J. Hong and Y. T. Cheng and M. Hong}, title = {{BTI} Characterization of {MBE} Si-Capped Ge Gate Stack and Defect Reduction via Forming Gas Annealing}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey, CA, USA, March 31 - April 4, 2019}, pages = {1--4}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/IRPS.2019.8720567}, doi = {10.1109/IRPS.2019.8720567}, timestamp = {Wed, 16 Oct 2019 14:14:55 +0200}, biburl = {https://dblp.org/rec/conf/irps/WanHCH19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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