BibTeX record conf/irps/VandendaeleGLMT18

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@inproceedings{DBLP:conf/irps/VandendaeleGLMT18,
  author       = {William Vandendaele and
                  Xavier Garros and
                  Thomas Lorin and
                  Erwan Morvan and
                  A. Torres and
                  Ren{\'{e}} Escoffier and
                  Marie{-}Anne Jaud and
                  Marc Plissonnier and
                  Fred Gaillard},
  title        = {A novel insight of pBTI degradation in GaN-on-Si E-mode MOSc-HEMT},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
                  CA, USA, March 11-15, 2018},
  pages        = {4},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/IRPS.2018.8353580},
  doi          = {10.1109/IRPS.2018.8353580},
  timestamp    = {Sat, 30 Sep 2023 09:49:39 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/VandendaeleGLMT18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}