BibTeX record conf/irps/VandemaeleKTSMC19

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@inproceedings{DBLP:conf/irps/VandemaeleKTSMC19,
  author       = {Michiel Vandemaele and
                  Ben Kaczer and
                  Stanislav Tyaginov and
                  Zlatan Stanojevic and
                  Alexander Makarov and
                  Adrian Vaisman Chasin and
                  Erik Bury and
                  Hans Mertens and
                  Dimitri Linten and
                  Guido Groeseneken},
  title        = {Full (V\({}_{\mbox{g}}\), V\({}_{\mbox{d}}\)) Bias Space Modeling
                  of Hot-Carrier Degradation in Nanowire FETs},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey,
                  CA, USA, March 31 - April 4, 2019},
  pages        = {1--7},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/IRPS.2019.8720406},
  doi          = {10.1109/IRPS.2019.8720406},
  timestamp    = {Wed, 24 May 2023 09:11:21 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/VandemaeleKTSMC19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}