BibTeX record conf/irps/VandemaeleKTFDC21

• > Home > conf/irps/VandemaeleKTFDC21

@inproceedings{DBLP:conf/irps/VandemaeleKTFDC21,
  author       = {Michiel Vandemaele and
                  Ben Kaczer and
                  Stanislav Tyaginov and
                  Jacopo Franco and
                  Robin Degraeve and
                  Adrian Vaisman Chasin and
                  Zhicheng Wu and
                  Erik Bury and
                  Yang Xiang and
                  Hans Mertens and
                  Guido Groeseneken},
  title        = {The properties, effect and extraction of localized defect profiles
                  from degraded {FET} characteristics},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
                  CA, USA, March 21-25, 2021},
  pages        = {1--7},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/IRPS46558.2021.9405164},
  doi          = {10.1109/IRPS46558.2021.9405164},
  timestamp    = {Wed, 24 May 2023 09:11:21 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/VandemaeleKTFDC21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}