BibTeX record conf/irps/UemuraKMH15a

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@inproceedings{DBLP:conf/irps/UemuraKMH15a,
  author       = {Taiki Uemura and
                  Takashi Kato and
                  Hideya Matsuyama and
                  Masanori Hashimoto},
  title        = {Soft error immune latch design for 20 nm bulk {CMOS}},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
                  CA, USA, April 19-23, 2015},
  pages        = {4},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/IRPS.2015.7112825},
  doi          = {10.1109/IRPS.2015.7112825},
  timestamp    = {Mon, 03 Jan 2022 22:37:46 +0100},
  biburl       = {https://dblp.org/rec/conf/irps/UemuraKMH15a.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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