BibTeX record conf/irps/UemuraCJJJJRPHL20

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@inproceedings{DBLP:conf/irps/UemuraCJJJJRPHL20,
  author       = {Taiki Uemura and
                  Byungjin Chung and
                  Jeongmin Jo and
                  Hai Jiang and
                  Yongsung Ji and
                  Tae{-}Young Jeong and
                  Rakesh Ranjan and
                  Youngin Park and
                  Kiil Hong and
                  Seungbae Lee and
                  Hwasung Rhee and
                  Sangwoo Pae and
                  Euncheol Lee and
                  Jaehee Choi and
                  Shota Ohnishi and
                  Ken Machida},
  title        = {Investigating of {SER} in 28 nm FDSOI-Planar and Comparing with {SER}
                  in Bulk-FinFET},
  booktitle    = {2020 {IEEE} International Reliability Physics Symposium, {IRPS} 2020,
                  Dallas, TX, USA, April 28 - May 30, 2020},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/IRPS45951.2020.9129644},
  doi          = {10.1109/IRPS45951.2020.9129644},
  timestamp    = {Tue, 24 Nov 2020 14:44:09 +0100},
  biburl       = {https://dblp.org/rec/conf/irps/UemuraCJJJJRPHL20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}