BibTeX record conf/irps/UemuraCJJJJRLRP20

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@inproceedings{DBLP:conf/irps/UemuraCJJJJRLRP20,
  author       = {Taiki Uemura and
                  Byungjin Chung and
                  Jeongmin Jo and
                  Hai Jiang and
                  Yongsung Ji and
                  Tae{-}Young Jeong and
                  Rakesh Ranjan and
                  Seungbae Lee and
                  Hwasung Rhee and
                  Sangwoo Pae and
                  Euncheol Lee and
                  Jaehee Choi and
                  Shota Ohnishi and
                  Ken Machida},
  title        = {Backside Alpha-Irradiation Test in Flip-Chip Package in {EUV} 7 nm
                  FinFET {SRAM}},
  booktitle    = {2020 {IEEE} International Reliability Physics Symposium, {IRPS} 2020,
                  Dallas, TX, USA, April 28 - May 30, 2020},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/IRPS45951.2020.9129331},
  doi          = {10.1109/IRPS45951.2020.9129331},
  timestamp    = {Tue, 24 Nov 2020 14:44:09 +0100},
  biburl       = {https://dblp.org/rec/conf/irps/UemuraCJJJJRLRP20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}