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BibTeX record conf/irps/UemuraCJJJJRLRP20
@inproceedings{DBLP:conf/irps/UemuraCJJJJRLRP20, author = {Taiki Uemura and Byungjin Chung and Jeongmin Jo and Hai Jiang and Yongsung Ji and Tae{-}Young Jeong and Rakesh Ranjan and Seungbae Lee and Hwasung Rhee and Sangwoo Pae and Euncheol Lee and Jaehee Choi and Shota Ohnishi and Ken Machida}, title = {Backside Alpha-Irradiation Test in Flip-Chip Package in {EUV} 7 nm FinFET {SRAM}}, booktitle = {2020 {IEEE} International Reliability Physics Symposium, {IRPS} 2020, Dallas, TX, USA, April 28 - May 30, 2020}, pages = {1--4}, publisher = {{IEEE}}, year = {2020}, url = {https://doi.org/10.1109/IRPS45951.2020.9129331}, doi = {10.1109/IRPS45951.2020.9129331}, timestamp = {Tue, 24 Nov 2020 14:44:09 +0100}, biburl = {https://dblp.org/rec/conf/irps/UemuraCJJJJRLRP20.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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