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BibTeX record conf/irps/ThiessenHH23
@inproceedings{DBLP:conf/irps/ThiessenHH23, author = {A. Thiessen and M. Haack and Markus Herklotz}, title = {Silicon based degradation model for various types of highly integrated {MOL} resistor devices}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2023, Monterey, CA, USA, March 26-30, 2023}, pages = {1--5}, publisher = {{IEEE}}, year = {2023}, url = {https://doi.org/10.1109/IRPS48203.2023.10118209}, doi = {10.1109/IRPS48203.2023.10118209}, timestamp = {Wed, 24 May 2023 09:43:44 +0200}, biburl = {https://dblp.org/rec/conf/irps/ThiessenHH23.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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