BibTeX record conf/irps/TatenoNOMKOHIYN21

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@inproceedings{DBLP:conf/irps/TatenoNOMKOHIYN21,
  author       = {Yasunori Tateno and
                  Ken Nakata and
                  Akio Oya and
                  Keita Matsuda and
                  Yoshihide Komatsu and
                  Shinichi Osada and
                  Masafumi Hirata and
                  Shigeyuki Ishiyama and
                  Toshiki Yoda and
                  Atsushi Nitta and
                  Tomio Sato},
  title        = {Investigation of the Failure Mechanism of InGaAs-pHEMT under High
                  Temperature Operating Life Tests},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
                  CA, USA, March 21-25, 2021},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/IRPS46558.2021.9405166},
  doi          = {10.1109/IRPS46558.2021.9405166},
  timestamp    = {Wed, 05 May 2021 14:20:15 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/TatenoNOMKOHIYN21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}