BibTeX record conf/irps/TangLZZWLSHK15

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@inproceedings{DBLP:conf/irps/TangLZZWLSHK15,
  author       = {Xiaoyu Tang and
                  J. Lu and
                  Rui Zhang and
                  Yi Zhao and
                  Wangran Wu and
                  Chang Liu and
                  Yi Shi and
                  Ziqian Huang and
                  Yuechan Kong},
  title        = {{PBTI} and {HCI} degradations of ultrathin body InGaAs-On-Insulator
                  nMOSFETs fabricated by wafer bonding},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
                  CA, USA, April 19-23, 2015},
  pages        = {7},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/IRPS.2015.7112838},
  doi          = {10.1109/IRPS.2015.7112838},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/TangLZZWLSHK15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}