BibTeX record conf/irps/TanakaHU19

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@inproceedings{DBLP:conf/irps/TanakaHU19,
  author       = {Kenichiro Tanaka and
                  Masahiro Hikita and
                  Tetsuzo Ueda},
  title        = {Influence of Donor-Type Hole Traps Under P-GaN Gate in GaN-Based Gate
                  Injection Transistor {(GIT)}},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey,
                  CA, USA, March 31 - April 4, 2019},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/IRPS.2019.8720560},
  doi          = {10.1109/IRPS.2019.8720560},
  timestamp    = {Sun, 25 Oct 2020 23:11:45 +0100},
  biburl       = {https://dblp.org/rec/conf/irps/TanakaHU19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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