BibTeX record conf/irps/SuzumuraOTAY20

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@inproceedings{DBLP:conf/irps/SuzumuraOTAY20,
  author       = {Naohito Suzumura and
                  Kazuyuki Omori and
                  Hideaki Tsuchiya and
                  Hideki Aono and
                  Tomohiro Yamashita},
  title        = {Impact of Anode-side Defect Generation on Inter-Level {TDDB} Degradation
                  in Cu/Low-k Damascene Structures},
  booktitle    = {2020 {IEEE} International Reliability Physics Symposium, {IRPS} 2020,
                  Dallas, TX, USA, April 28 - May 30, 2020},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/IRPS45951.2020.9129094},
  doi          = {10.1109/IRPS45951.2020.9129094},
  timestamp    = {Wed, 20 Jan 2021 09:07:40 +0100},
  biburl       = {https://dblp.org/rec/conf/irps/SuzumuraOTAY20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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