BibTeX record conf/irps/SuzukiDNMT18

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@inproceedings{DBLP:conf/irps/SuzukiDNMT18,
  author       = {Shun Suzuki and
                  Yoshiaki Deguchi and
                  Toshiki Nakamura and
                  Kyoji Mizoguchi and
                  Ken Takeuchi},
  title        = {Error elimination {ECC} by horizontal error detection and vertical-LDPC
                  {ECC} to increase data-retention time by 230{\%} and acceptable bit-error
                  rate by 90{\%} for 3D-NAND flash SSDs},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
                  CA, USA, March 11-15, 2018},
  pages        = {7--1},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/IRPS.2018.8353680},
  doi          = {10.1109/IRPS.2018.8353680},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/SuzukiDNMT18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}