BibTeX record conf/irps/SunbulAHRRDLKRO22

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@inproceedings{DBLP:conf/irps/SunbulAHRRDLKRO22,
  author       = {Ayse S{\"{u}}nb{\"{u}}l and
                  Tarek Ali and
                  Raik Hoffmann and
                  Ricardo Revello and
                  Yannick Raffel and
                  Pardeep Duhan and
                  David Lehninger and
                  Kati K{\"{u}}hnel and
                  Matthias Rudolph and
                  Sebastian Oehler and
                  Philipp Schramm and
                  Malte Czernohorsky and
                  Konrad Seidel and
                  Thomas K{\"{a}}mpfe and
                  Lukas M. Eng},
  title        = {Impact of Temperature on Reliability of {MFIS} HZO-based Ferroelectric
                  Tunnel Junctions},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2022, Dallas,
                  TX, USA, March 27-31, 2022},
  pages        = {11--1},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/IRPS48227.2022.9764585},
  doi          = {10.1109/IRPS48227.2022.9764585},
  timestamp    = {Sat, 30 Sep 2023 09:49:39 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/SunbulAHRRDLKRO22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}