BibTeX record conf/irps/StoffelsPDBTSFZ19

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@inproceedings{DBLP:conf/irps/StoffelsPDBTSFZ19,
  author       = {Steve Stoffels and
                  Niels Posthuma and
                  Stefaan Decoutere and
                  Benoit Bakeroot and
                  Andrea Natale Tallarico and
                  Enrico Sangiorgi and
                  Claudio Fiegna and
                  J. Zheng and
                  X. Ma and
                  Matteo Borga and
                  Elena Fabris and
                  Matteo Meneghini and
                  Enrico Zanoni and
                  Gaudenzio Meneghesso and
                  Juraj Priesol and
                  Alexander Satka},
  title        = {Perimeter Driven Transport in the p-GaN Gate as a Limiting Factor
                  for Gate Reliability},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey,
                  CA, USA, March 31 - April 4, 2019},
  pages        = {1--10},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/IRPS.2019.8720411},
  doi          = {10.1109/IRPS.2019.8720411},
  timestamp    = {Tue, 07 May 2024 20:11:34 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/StoffelsPDBTSFZ19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}